agilent E6832A w-cdma calibration application for the e6601a wireless communications test set data sheet e6601a/e6890a features and general speci? cations ? cw, am, fm, dsb-sc source modulation ? rf analyzer ? spectrum monitor ? transmitter power measurements ? power versus time measurement ? frequency error measurement ? optional iq capture waveform sampling ? internal ocxo timebase ? built-in open windows xp pc ? built-in help system ? run test programs with internal or external pc ? gpib, usb, and lan connectivity and control E6832A features source modulation ? cw, amplitude, frequency, w-cdma power measurements ? mean power ? root-raised cosine power spectral measurements ? spectrum emission mask ? adjacent channel leakage ? spectrum monitor modulation quality ? cw frequency error ? dpch evm, obw, frequency error the next generation of mobile phone manufacturing test. e6601a is the newest test set from agilent technologies, designed especially for high-volume, test-mode manufacturing. combining industry-leading measurement speed, selectable formats, ? exible licensing, and an integrated open windows ? xp pc, the e6601a helps you achieve the lowest cost of test in mobile phone manufacturing. the e6601a and its available technology-speci? c software applications deliver industry leading measurement speed and accuracy for your mobile phone test needs. the agilent E6832A w-cdma calibration application is a non-signaling application optimized for w-cdma and hsdpa mobile phone calibration. the E6832A also provides a choice of perpetual, transportable, or term licenses for maximizing asset utilization and your cost per test. the test set and its applications use emerging advancements such as fast device tune features to deliver fast, high-quality calibration. because its agilent, you can be con? dentit operates using trusted, proven measurement methodology that ensures measure- ment integrity that is never compromised.
2 technical speci? cations these speci? cations apply to an e6601a mainframe and the E6832A w-cdma calibration application ? rmware revision a.04 or higher. only feature additions beyond the e6890a general purpose application are included in this document. speci? cations describe the test sets warranted performance and are valid for the units operation within 10 c of the last self alignment. all speci? ca- tions are valid after a 30-minute warm-up period of continuous operation with valid self alignment. if the instrument has been off for longer than 48 hours, a 48-hour warm-up period followed by self alignment is required. supplemental characteristics are intended to provide typical, but non-warranted, performance parameters that may be useful in applying the instrument. these characteristics are shown in italics and labeled as typical. all units shipped from the factory meet these typical numbers at +25 c ambient temperature without including measurement uncertainty. rf generator frequency w-cdma cellular bands band i imt-2000 2112 to 2168 mhz band ii u.s. pcs 1932 to 1988 mhz band iii dcs/pcs 1807 to 1878 mhz band iv 2112 to 2153 mhz band v u.s. cellular 871 to 892 mhz band vi umts800 877 to 883 mhz band vii umts2600 2620 to 2690 mhz band viii umts900 927 to 958 mhz band ix umts1700 1844 to 1880 mhz band x umts extended 2110 to 2170 mhz band xi umts1500 1475.9 to 1500.9 mhz output level signal level is measured using a root-raised cosine (rrc) ? lter with a roll-off a = 0.22 and a 3.84 mhz bandwidth. output level renges rf in/out port C115 to C13 dbm/3.84 mhz rf out only port C115 to C5 dbm/3.84 mhz composite signal absolute level accuracy (< 10 c and < 24 hours from last self alignment, C108 to C15 dbm / 3.84 mhz) rf in/out port < 1.0 db, typically < 0.65 dbm rf out only port < 1.0 db, typically < 0.65 dbm qpsk modulation residual evm typically < 3% rf analyzer frequency w-cdma cellular bands band i imt-2000 1922 to 1978 mhz band ii u.s. pcs 1852 to 1908 mhz band iii dcs/pcs 1712 to 1783 mhz band iv 1712 to 1753 mhz band v u.s. cellular 826 to 847 mhz band vi umts800 832 to 838 mhz band vii umts2600 2500 to 2570 mhz band viii umts900 882 to 913 mhz band x umts extended 1710 to 1770 mhz band xi umts1500 1427.9 to 1452.9 mhz band ix umts1700 1749 to 1785 mhz input level ranges average power C65 to +28 dbm/3.84 mhz peak power C65 to +37 dbm/3.84 mhz (5 w) self alignment validity 10 c change and 30 days from last self alignment
3 dpch measurement suite includes mean and rrc-? ltered mean power, spectrum emission mask, aclr, composite evm frequency error, pcde, and occupied bandwidth measurements. trigger setup delay C20 to +20 ms sources external, fall, immediate, rise mean and rrc-? ltered mean power measurements input level range average power C61 to +28 dbm/3.84 mhz measurement accuracy1 C54 to +28 dbm/3.84 mhz < 0.6 db, typically < 0.3 db C61 to < C54 dbm/3.84 mhz < 0.7 db, typically < 0.4 db with < 48 hours warm-up before self alignment initiated C54 to +28 dbm/3.84 mhz < 0.7 db, typically < 0.3 db C61 to < C54 dbm/3.84 mhz < 0.8 db, typically < 0.4 db measurement repeatability typically < 0.05 db filter mean power mean power-compliant ? lter rrc-? ltered mean power 3.84 mhz spectrum emission mask (sem) measurement this measurement provides a ratio of the transmitted power in a 3.84 mhz rrc bandwidth to offset frequencies, which are between 2.5 mhz and 12.5 mhz away from the ue carrier frequency. input level range average power +5 to +28 dbm/3.84 mhz measurement accuracy 2.5 to 12.5 mhz < 1.5 db, typically < 0.5 db offset frequency measurement bandwidths 2.5 to 3.5 mhz offsets 30 khz 3.5 to 12.5 mhz offsets 1 mhz in-band measurement ? lte r 3.84 mhz (rrc) adjacent channel leakage ratio (aclr) measurement this measurement provides a ratio of the ? ltered mean trans- mitted power to the ? ltered mean power in an adjacent channel. both the transmitted and the adjacent channel powers are measured with a ? lter that has an rrc response with roll-off a = 0.22 and a bandwidth equal to the chip rate. input level range average power +5 to +28 dbm/3.84 mhz measurement accuracy 5 mhz offsets at C33 db < 0.8 db, typically < 0.4 db 10 mhz offsets at C43 db < 0.8 db, typically < 0.4 db residual noise ? oor 5 mhz offsets typically < C53 dbc 10 mhz offsets typically < C63 dbc filter 3.84 mhz (rrc) error vector magnitude (evm) measurement this measurement calculates composite evm and several other results relating to ue modulation quality. input level range average power C25 to +28 dbm/3.84 mhz ue ranges evm 35% rms frequency error < 1 khz timing error < 50 chips evm measurement accuracy (includes residual evm) ue evm 0% rms < 2.5% rms ue evm 17.5% rms < 0.7% rms ue evm 35% rms < 0.5% rms filter 3.84 mhz (rrc) measurement results evm, magnitude error, phase error, origin offset 1. additional accuracy error when using rf out only port is < 0.1 db.
4 frequency error measurement input level range average power C25 to +28 dbm/3.84 mhz ue ranges evm 35% rms frequency error < 1 khz timing error < 50 chips filter 3.84 mhz (rrc) measurement accuracy < (5 hz + timebase accuracy) peak code domain error (pcde) measurement input level range average power C25 to +28 dbm/3.84 mhz ue ranges evm 35% rms frequency error < 1 khz timing error < 50 chips filter 3.84 mhz (rrc) measurement accuracy < 0.3 db occupied bandwidth (obw) measurement this measurement calculates the bandwidth containing 99.0% of the total integrated power of the transmitted signal, centered on the channel frequency. input level range average power +5 to +28 dbm/3.84 mhz measurement accuracy < 60 khz at 99.0% total integrated power dynamic power measurement input level range average power C61 to +28 dbm/3.84 mhz amplitude capture range with 4 db crest factor < 2 db of expected power measurement accuracy1 +2 to C45 db of expected power C54 to +28 dbm/3.84 mhz < 0.6 db, typically < 0.3 db C61 to < C54 dbm/3.84 mhz < 0.7 db, typically < 0.4 db +2 to C45 db of expected power with < 48 hours warm-up before self alignment initiated C54 to +28 dbm/3.84 mhz < 0.7 db, typically < 0.3 db C61 to < C54 dbm/3.84 mhz < 0.8 db, typically < 0.4 db measurement repeatability returning to same level typically < 0.05 db and frequency, no temperature change and insigni? cant time change trigger setup sources external, fall, rise filters 1 khz 30 khz 100 khz 300 khz 640 khz 1.23 mhz 1.28 mhz 1.6 mhz 3.84 mhz 5.0 mhz 8psk estimated carrier power gsm tx power w-cdma mean power 1. additional accuracy error when using rf out only port is < 0.1 db.
5 fast device tune measurement allows simultaneous calibration of a devices transmitter output power and receiver input level across level and frequency in a single sweep (per frequency band). the device must operate in a test mode, which forces it to transmit a prede? ned series of power steps at various uplink frequencies, and also forces it to simultaneously tune its receiver to perform measurements (such as rssi) of the test sets signal at various downlink frequencies and power levels. input level range average tx power C61 to +28 dbm/3.84 mhz measurement interva l 1 timeslot (667 s) measurement ? lter w-cdma mean power power measurement accuracy1 0 to C45 db of expected power and 20 to 55 c C54 to +28 dbm/3.84 mhz < 0.75 db, typically < 0.4 db C61 to < C54 dbm/3.84 mhz < 0.85 db, typically < 0.5 db 0 to C45 db of expected power and 20 to 55 c with 48-hours warm-up before self alignment initiated C54 to +28 dbm/3.84 mhz < 0.85 db, typically < 0.4 db C61 to < C54 dbm/3.84 mhz < 0.95 db, typically < 0.5 db output level ranges (rx level at) rf in/out port C108 to C15 dbm/3.84 mhz rf out only port C108 to C5 dbm/3.84 mhz composite signal absolute output level accuracy (< 10 c and < 24 hours from last self alignment) C108 to C15 dbm/ < 1.0 db, typically < 0.65 dbm 3.84 mhz at rf in/out port C108 to C5 dbm/ < 1.0 db, typically < 0.65 dbm 3.84 mhz at rf out only port output level settling (rx level within 0.1 db) amplitude switch < 1 ms, typically < 250 s frequency switch within band < 1 ms, typically < 500 s step size range 5 to 20 ms trigger setup sources immediate, rise 1. additional accuracy error when using rf out only port is < 0.1 db.
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